No87 : two - stage image processing in high resolution electron microscopy , f . h . li , proc . intern . congress on electron microscopy , paris ( 1994 ) vol . 1 , 481 - 4 高分辨电子显微术与电子衍射相结合测定晶体结构,李方华,自然科学进展- - -国家重点实验室通讯, 3 ( 1993 ) 385 - 394
No142 : use of dynamical scattering in the structure determination of cebaite by high resolution electron microscopy , f . h . li and h . hashimoto , acta cryst . , b40 ( 1984 ) 454 用直接法处理高分辨电子显微像,范海福、钟子洋、郑朝德、李方华,电子显微学报, 3 ( 1984 ) no . 4 , 4 。
Saed ( selected area electron diffraction ) , hrem ( high resolution electron microscopy ) and eds ( energy dispersive spectrum ) experiments confirmed that both the porous layer and lamellar layer are composed of nano - crystalline ha ( hydroxyapatite ) 实验中采用了选区电子衍射、高分辨观察和x - ray能谱等实验手段,分析了羟基磷灰石各层的形态、成分与微结构。
The morphology and structure of ti - dlc films were investigated by high resolution electron microscopy ( hrem ) , atomic force microscopy ( afm ) , scanning electron microscopy ( sem ) and raman spectroscopy . the mechanical properties were investigated by a mts nano indenter xp system with a berkovich indenter . the ti - dlc film with a titanium content of 27at . % 利用高分辨电子显微镜( hrem ) 、原子力显微镜( afm ) 、扫描电镜( sem )和拉曼光谱仪等手段分析了沉积ti - dlc薄膜的成分、形貌和结构,使用带berkovich压头的纳米压痕仪( mtsnanoindenterxp )测试了薄膜的力学性能。
More recent studies show nanowires products with narrow dismeter distribution around 5 - 10mn and lengths ranging from several hundred nanometers to several micrometers can be obtained if the mixture solution of naoh and koh was replaced by koh solution . the nanowires were analyzed by a range of methods including powder x - ray diffraction ( xrd ) , high resolution electron microscopy ( hrem ) , selected area electron diffraction ( saed ) , electron energy loss spectroscopy ( eels ) , xrd and hrem image simulations . the structure of nanowires is determinded to be of the type of k2ti6oi3 利用x射线衍射( xri ) ) 、高分辨电子显微镜( hrtem ) 、选区电子衍射( saed ) 、电子能量损失谱( eels )以及x射线衍射和高分辨像模拟等分析测试手段,初步分析了这种纳米线的生长机理,探讨了她的结构和光学性能,实验结果显示这种纳米线具有kzti6o ; 3的结构,紫外一可见光吸收光谱显示, kzti6ol3纳米线禁带宽度约为3 . 45ev 。